发明名称 SPUTTER FILM FORMING METHOD, SPUTTER FILM FORMING DEVICE AND PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a compd. film having a stable compsn. and to facilitate the compositional control in the compd. film by using stable plasma wide in a process window as for a high frequency sputter film forming method. SOLUTION: In a high frequency sputter film forming method, a part or the whole part of a wall positioned at the outside of a space formed by a wafer and a target 14 is applied with A.C. voltage or A.C. current, or high frequency electric power is pulse-oscillated to reduce the temp. of electrons in plasma, or as the gas for sputtering, at least one kind of gas among helium, neon, xenon and krypton is contained. Otherwise, a part or the whole part of the wall positioned at the outside of the space formed by the wafer and the target is applied with minus voltage.
申请公布号 JPH11343569(A) 申请公布日期 1999.12.14
申请号 JP19980152749 申请日期 1998.06.02
申请人 FUJITSU LTD 发明人 MIHARA SATOSHI
分类号 H01L21/20;C23C14/08;C23C14/34;H01L21/203;H01L21/314;H01L21/316;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L21/20
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