发明名称 METHOD AND INSTRUMENT FOR ANALYZING ORGANIC SUBSTANCE FOR IMPURITY
摘要 PROBLEM TO BE SOLVED: To analyze organic substances for impurities with high accuracy in a state where the risk of contamination is reduced without requiring any pre-treatment by performing the drying and ashing of sample solutions in an oxidizing gas atmosphere and vaporizing the products of ashing in an inert gas atmosphere. SOLUTION: After a sample solution 307 is introduced to a sample introducing section by, for example, 100μm, the sample introducing section is heated up to, for example, 700 deg.C while an oxygen gas containing 1 vol.% ozone is supplied to the sample introducing section from an oxidizing gas cylinder 304. When the sample introducing section is heated, organic components are completely decomposed and removed and the residues of impurities are left in the sample introducing section. Depending upon the composition, flow rate, etc., of the oxidizing gas, the decomposition and removal of the organic components end within several minutes. When the decomposition and removal end, the impurity components are vaporized while Ar gas is introduced to the sample introducing section as an inert gas by operating a gas change-over valve 306 and the vapor is analyzed by atomic absorption. Therefore, all treatment performed on the sample from the decomposition and removal of the organic components to the analysis of the impurity components can be executed in the sample introducing section only.
申请公布号 JPH11344440(A) 申请公布日期 1999.12.14
申请号 JP19980153034 申请日期 1998.06.02
申请人 NEC CORP 发明人 TSUJI MIKIO
分类号 G01N21/73;G01N1/22;G01N1/28;G01N21/31;(IPC1-7):G01N21/31 主分类号 G01N21/73
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