| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a test circuit capable of arbitrarily changing the constitution, and high in recycling possibility. SOLUTION: A semiconductor integrated circuit device is provided with a plurality of registers REG1-REG8 which are successively connected to each other, a switching circuit 1 connected between stages of the registers, and a register length judging circuit to output the bit width setting signal, and each switching circuit 1 is provided with an AND gate G1 and an EXOR gate G. When the corresponding data in the parallel control data S11-S17 is [1], the register output of the final stage is outputted without any change, and the corresponding EXOR gate G2 outputs the output of the AND gate G1, the register output of the previous stage, and the exclusive logical sum. When the corresponding data in the parallel control data S11-S17 is [1], the EXOR gate G2 functions as a feedback point. The bit width of MFSR and the position of the feedback point can be arbitrarily set by the logic of the externally fed parallel control data S11-S19.</p> |
