CLEANING METHOD FOR IC TEST SOCKET,申请号JP19980164301-传众专利搜索

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发明名称	CLEANING METHOD FOR IC TEST SOCKET
摘要
申请公布号	JPH11339914(A)	申请公布日期	1999.12.10
申请号	JP19980164301	申请日期	1998.05.28
申请人	YAC CO LTD	发明人	KIMURA TOSHIAKI
分类号	H01R33/76;H01L23/32;(IPC1-7):H01R33/76	主分类号	H01R33/76
代理机构		代理人
主权项
地址

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