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发明名称
CIRCUIT AND METHOD FOR TESTING DUMMY NORMALITY OF MEMORY PATROL FUNCTION
摘要
申请公布号
JPH11338785(A)
申请公布日期
1999.12.10
申请号
JP19980145571
申请日期
1998.05.27
申请人
NEC CORP
发明人
SAWA HANAE
分类号
G06F12/16;(IPC1-7):G06F12/16
主分类号
G06F12/16
代理机构
代理人
主权项
地址
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