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发明名称
TESTING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH11337627(A)
申请公布日期
1999.12.10
申请号
JP19980141498
申请日期
1998.05.22
申请人
MITSUBISHI ELECTRIC CORP
发明人
HIYOUZO MASAHIKO
分类号
G01R31/3183;(IPC1-7):G01R31/318
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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