发明名称 SEMICONDUCTOR LASER, SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To reduce the threshold current density of a short wavelength semiconductor laser by constituting the thickness of an active layer with the single gain layer to be larger than a specified thickness, and an optical guide layer installed between the active layer and a clad layer. SOLUTION: A clad layer 2 is formed on a substrate 1. An active layer 4 is formed of a single gain layer, whose thickness is not less than 3 nm on the clad layer 2 through an optical guide layer 3. Namely, a single-well layer is formed when quantum well structure is formed, and the single active layer is formed, when structure is not formed. Consequently, the scattering of impurities is reduced and the mobility of holes is improved by setting the active layer 4 to be an undoped layer. A clad layer 6 is stacked and formed on the active layer 4 through a light guide layer 5. Thus, the threshold current density of a short wavelength semiconductor laser can be reduced.
申请公布号 JPH11340580(A) 申请公布日期 1999.12.10
申请号 JP19980215147 申请日期 1998.07.30
申请人 FUJITSU LTD 发明人 DOUMEN MEGUMI;KURAMATA AKITO;KUBOTA SHINICHI;SOEJIMA REIKO
分类号 H01L21/205;H01L33/06;H01L33/32;H01L33/34;H01S5/00;H01S5/323;H01S5/343 主分类号 H01L21/205
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