发明名称 Measurement of the surface reflectivity of an antireflective transparent film used e.g. for CRT, LCD, plasma, electroluminescent and RE displays
摘要 The surface reflectivity of a transparent film (100) having antireflective properties is calculated from the back face reflectivity, the total reflectivity and the transparency of the film. Independent claims are also included for the following: (i) a method of producing a transparent film (100) having antireflective properties, in which a sample of the film is subjected to the above measurement process; and (ii) an apparatus for carrying out the above measurement process.
申请公布号 DE19925645(A1) 申请公布日期 1999.12.09
申请号 DE19991025645 申请日期 1999.06.04
申请人 SONY CORP., TOKIO/TOKYO 发明人 MITSUHASHI, SHINOBU
分类号 G01N21/47;C03C17/34;G01M11/02;G01N21/59;G02B1/11;(IPC1-7):G01N21/00;H01J29/88 主分类号 G01N21/47
代理机构 代理人
主权项
地址