发明名称 |
Measurement of the surface reflectivity of an antireflective transparent film used e.g. for CRT, LCD, plasma, electroluminescent and RE displays |
摘要 |
The surface reflectivity of a transparent film (100) having antireflective properties is calculated from the back face reflectivity, the total reflectivity and the transparency of the film. Independent claims are also included for the following: (i) a method of producing a transparent film (100) having antireflective properties, in which a sample of the film is subjected to the above measurement process; and (ii) an apparatus for carrying out the above measurement process.
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申请公布号 |
DE19925645(A1) |
申请公布日期 |
1999.12.09 |
申请号 |
DE19991025645 |
申请日期 |
1999.06.04 |
申请人 |
SONY CORP., TOKIO/TOKYO |
发明人 |
MITSUHASHI, SHINOBU |
分类号 |
G01N21/47;C03C17/34;G01M11/02;G01N21/59;G02B1/11;(IPC1-7):G01N21/00;H01J29/88 |
主分类号 |
G01N21/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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