| 摘要 |
When an automatic circuit tester (10) detects that a fault has occurred in a circuit board (14), it applies to the circuit board (14) a sequence of vectors that differs from the test sequence (Tn, Tn+1) by which the fault detection occurs only in that each vector's component that corresponds to an input pin in question on the board device under test maintains a level that simulates an open circuit at that input pin. If the resultant response differs from the response to the original test sequence, the input pin can often be ruled out as one at which a fault has occurred. In this way, many open-circuit faults at input pins can be diagnosed without special probing, even when several such faults occur simultaneously. <IMAGE> <IMAGE> |
