发明名称 Ion scattering spectrometer
摘要 <p>From an ion source and accelerator an ion beam is generated, this ion beam is let go through a circular hole bored in the center of a detector and orifices to irradiate a sample in a sample chamber. The detector detects particles scattered from the sample and arrived at the detector through the orifices. With exhaust units and orifices, the region surrounding the detector is exhausted to be a prescribed degree of vacuum of higher vacuum than the inside of the sample chamber.</p>
申请公布号 EP0962958(A1) 申请公布日期 1999.12.08
申请号 EP19990110421 申请日期 1999.05.28
申请人 THE INSTITUTE OF PHYSICAL & CHEMICAL RESEARCH 发明人 AONO, MASAKAZU;KOBAYASHI, TAKANE
分类号 H01J37/18;H01J37/252;H01J49/40;(IPC1-7):H01J49/44;H01J37/30;H01J37/32;G01N23/203;H01J37/317;H01J37/301;H01J37/305 主分类号 H01J37/18
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