发明名称 ADJUSTMENT INSPECTION SYSTEM FOR ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To perform the adjustment inspection operations effectively by electrically connecting an electronic apparatus with an adjustment inspecting device at each adjustment inspection process without inserting or pulling off connectors, etc., at each inspection process or locating a pallet accurately on a transport path. SOLUTION: An adjustment inspection system for electronic apparatus is composed of a pallet 1 transported along a certain transport path in the condition that a VTR2 to be inspected is placed thereon, a first shoe terminal 6 installed on each pallet 1 and connected electrically to the VTR2 on the pallet 1, second shoe terminals 12 installed for respective inspection processes set on the transport path and put in slide contact with the first shoe terminal 6 in the specified range in the transporting direction of the pallet 1 when it is transported to each inspection process, and an adjustment inspecting device connected electrically with the second shoe terminals 12 in order to perform the adjustment inspection of the VTR2 at each inspection process.
申请公布号 JPH11334851(A) 申请公布日期 1999.12.07
申请号 JP19980140664 申请日期 1998.05.22
申请人 SONY CORP 发明人 SASAKI MUTSUMI;UCHIYAMA TOSHIHARU
分类号 G01R31/00;B65G43/00;H05K13/00 主分类号 G01R31/00
代理机构 代理人
主权项
地址