发明名称 Process for controlled orientation of ferroelectric layers
摘要 There is disclosed a structure of and a method for fabricating a ferroelectric film on a non-conductive substrate. An adhesion layer, e.g., a layer of silicon dioxide and a layer of zirconium oxide, is deposited over a substrate. A conductive layer, e.g., a noble metal, a non-noble metal, or a conductive oxide, is deposited over the adhesion layer. A seed layer, e.g., a compound containing lead, lanthanum, titanium, and oxygen, with a controlled crystal lattice orientation, is deposited on the conductive layer. This seed layer has ferroelectric properties. Over the seed layer, another ferroelectric material, e.g., lead zirconium titanate, can be deposited with a tetragonal or rhombohedral crystalline lattice structure with predetermined and controlled crystal orientation.
申请公布号 US5998236(A) 申请公布日期 1999.12.07
申请号 US19980024246 申请日期 1998.02.17
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 ROEDER, JEFFREY;VAN BUSKIRK, PETER C.
分类号 H01L21/02;H01L21/314;H01L21/316;(IPC1-7):H01L21/20 主分类号 H01L21/02
代理机构 代理人
主权项
地址