| 摘要 |
A method and system for identifying the configuration of a memory module from a list of memory module parts uses contact test results on the memory module to determine data, control and address lines connected to the module. The memory module data, control and address line configurations as determined by the contact test are compared with data, control and address line configuration information from a list of potential memory parts. Non-matching memory parts from the list are eliminated from further testing, resulting in a reduced number of read and write cycles used by the tester to identify parts located on the memory module. The tester counts the number of data lines connected to the memory module to determine the width of the memory parts. The tester then performs a read and write operation to determine the number of memory banks located on the memory module and the control line configuration of the memory module. The tester then runs address tests for matching parts of the parts list to determine the depth of the parts loaded on the module, allowing identification of the parts loaded on the module, and resulting in identification of the memory module's configuration.
|
