发明名称 |
Integrated circuit tester with compensation for leakage current |
摘要 |
In an integrated circuit tester module, pin electronics circuitry supplies leakage current to a circuit node which is connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source at a first potential level, supplying current to the circuit node from a second potential level, and measuring current supplied to the circuit node from the voltage source. The second potential level is selectively varied in a manner such as to reduce the current supplied from the voltage source substantially to zero. The circuit node is then disconnected from the voltage source. |
申请公布号 |
US5999008(A) |
申请公布日期 |
1999.12.07 |
申请号 |
US19970846776 |
申请日期 |
1997.04.30 |
申请人 |
CREDENCE SYSTEMS CORPORATION |
发明人 |
CURRIN, JEFFREY D.;PUN, HENRY Y. |
分类号 |
G01R31/26;G01R31/28;G01R31/30;G01R31/319;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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