发明名称 System and method for edge termination of parallel conductive planes in an electrical interconnecting apparatus
摘要 <p>A system and method are presented for stabilizing the electrical impedance of a structure (e.g., an electrical interconnecting apparatus) including a pair of parallel planar conductors separated by a dielectric layer. The structure may be, for example, a PCB, a component of a semiconductor device package, or formed upon a surface of an integrated circuit substrate. An electrical resistance connected between the planar conductors about a periphery of the structure serves to stabilize the electrical impedance of the structure, thereby reducing an amount of electromagnetic energy radiated from the structure. The electrical resistance may be multiple discrete electrical resistances dispersed about the periphery of the structure, and the structure need not be rectangular. For example, a portion of the periphery of the structure may define a curve. A general method for stabilizing the electrical impedance of the structure includes selecting a spacing distance. A grid is generated by superimposing two orthogonal sets of parallel lines upon one another, wherein the parallel lines within each set are separated by the spacing distance. The grid is dimensioned such that it completely covers the structure when overlayed upon the structure. The characteristic impedance of the structure may then be estimated using a physical dimension of the grid. The value of the electrical resistance may then be computed using the estimated characteristic impedance of the structure. The grid may also be used to determine the location of the discrete electrical resistances.</p>
申请公布号 AU4000999(A) 申请公布日期 1999.12.06
申请号 AU19990040009 申请日期 1999.05.18
申请人 SUN MICROSYSTEMS, INC. 发明人 ISTVAN NOVAK;WAI-YEUNG YIP
分类号 H01P1/26;H03H7/38;H05K1/02;H05K1/11 主分类号 H01P1/26
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