发明名称 Pad signal detecting circuit in a semiconductor device for detecting a reference voltage in a high-speed interface
摘要 A pad signal detecting circuit for detecting a reference voltage input to a pad of a semiconductor device. This invention may be used in high speed terminated interfaces using a reference voltage, such as those using stub series termination logic (SSTL). The invention allows the manufacture of semiconductor devices having more than one type of interface, because the device can sense the type of interface which is connected to the pad and activate the appropriate interface circuitry. This feature eliminates the need to manufacture different devices for different types of interfaces, and it facilitates high volume and low cost production of semiconductor devices that are compatible with more than one type of interface circuitry.
申请公布号 US5999021(A) 申请公布日期 1999.12.07
申请号 US19970912654 申请日期 1997.08.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, HYUN-SOON
分类号 G11C11/401;G06F3/00;G11C7/00;H03K5/08;H03K19/0175;H03K19/0185;(IPC1-7):H03K5/00;H03K17/00 主分类号 G11C11/401
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