| 摘要 |
The circuit arrangement is used for burn-in systems for testing chips by means of a board. The chips are arranged in a matrix arrangement in the board. In the board the chips can be connected to input/output channels (4,5) and are activated group-wise by scan signals (1). For each scan signal (1), an input channel is provided via a diode (2,3) to activate the input/output channel (4,5). Preferably the chip is a memory. When data is written into the memory, both input channels associated with a scan signal are activated simultaneously. On reading data from the memory these input channels (4,5) are sequentially activated.
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