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发明名称
SEMICONDUCTOR MEMORY TESTING DEVICE
摘要
申请公布号
KR100232995(B1)
申请公布日期
1999.12.01
申请号
KR19980030594
申请日期
1998.07.29
申请人
MITSUBISHI DENKI KABUSHIKI KAISHA
发明人
OSAWA, TOKUYA;MAENO, HIDESHI
分类号
G01R31/26;H01L21/66;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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