发明名称 VISUAL INSPECTION DEVICE FOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To improve reliability for detecting a recognition mark in a visual inspection device for a substrate. SOLUTION: A discriminating means is provided for discriminating the position of a recognition mark 10 based on light receiving information by a photodetector to improve reliability for detection of a recognition mark. This means for discriminating the position comprises the position data for detecting the position of the recognition mark 10 based on the light receiving position of the photodetector, and a light amount data for discriminating the position of the recognition mark 10, based on the amount of receiving light. Thus, reliability for detecting the recognition mark can be improved.
申请公布号 JPH11330800(A) 申请公布日期 1999.11.30
申请号 JP19980132989 申请日期 1998.05.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ICHIKAWA IWAO
分类号 G01B11/30;G01N21/88;G01N21/956;H05K3/00;H05K3/34;H05K13/08 主分类号 G01B11/30
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