发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE AND TRANSFER MOLD DEVICE THEREOF
摘要 PROBLEM TO BE SOLVED: To suppress the occurrence of package cracks due to gate part curing resin which is left in an encapsulated body. SOLUTION: This transfer mold device is constituted of injecting melted resin from a gate 20 into a cavity 22 formed by a molding die consisting of upper and lower dies and then curing the injected resin. The device has a gate cutting mechanism for dividing the resin held at a liquid state, during curing or at a cured state by a gate cutting shutter 25 built in the molding die. The division of resin by the shutter 25 is constituted so as to divide the resin on a boundary part between the gate 20 and the cavity 22. Respective gate cutting shutters 25, corresponding to respective cavities 22 of the molding die are constituted so as to execute dividing operation by a single dividing mechanism. The cavity 22 of the molding die constitutes a cavity for forming a resin encapsulated type semiconductor device.
申请公布号 JPH11330112(A) 申请公布日期 1999.11.30
申请号 JP19980127019 申请日期 1998.05.11
申请人 HITACHI LTD;AKITA DENSHI KK 发明人 SATO YUJI
分类号 B29C45/38;B29C45/02;B29C45/14;B29K101/10;B29K105/20;H01L21/56 主分类号 B29C45/38
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