发明名称 DUAL DAMASKING TECHNOLOGY
摘要 PROBLEM TO BE SOLVED: To provide, in a simple process, dual damasking technology for forming dual damask structure without the occurrence of misalignments. SOLUTION: The forming technology of dual damask structure contains a process for forming an oxide layer 56 and a mask layer 58 on the oxide layer 56. The oxide layer 56 and the mask layer 58 have projections 57 positioned above first conduction layers 54. Chemical-mechanical polishing is executed, and the projections are removed. Then, an opening 59 is formed. A second conductive layer 68 is formed in the opening 59, and the second conductive layer 68 is brought into contact with the first conductive layer 54.
申请公布号 JPH11330077(A) 申请公布日期 1999.11.30
申请号 JP19980186244 申请日期 1998.07.01
申请人 UNITED MICROELECTRONICS CORP 发明人 TSAI MENG JIN
分类号 H01L21/302;H01L21/027;H01L21/304;H01L21/3065;H01L21/3205;H01L21/768;(IPC1-7):H01L21/320;H01L21/306 主分类号 H01L21/302
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