发明名称 WAFER SENSING AND CLAMPING MONITOR
摘要 A wafer position and clamp sensor. A circuit 114 monitors capacitance between two electrodes 22,24 within a wafer support 14,16,18,20. With no wafer 12 on the support, the capacitance falls in one range, with the wafer in place but not clamped, the capacitance falls in a second range and with the wafer held in place by an electrostatic attraction the capacitance falls in a third range. The sensed capacitance is converted to a frequency and then a DC voltage level 164 that can easily be sensed and used to confirm wafer placement and then confirm wafer clamping.
申请公布号 CA2113290(C) 申请公布日期 1999.11.30
申请号 CA19942113290 申请日期 1994.01.13
申请人 EATON CORPORATION 发明人 BLAKE, JULIAN GASKILL;TU, WEILIN;STONE, DALE KEITH;HOLDEN, SCOTT CARELTON
分类号 B23Q3/15;G01R27/26;H01L21/265;H01L21/683;(IPC1-7):H01L21/68 主分类号 B23Q3/15
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