| 摘要 |
According to the inventive thermomechanical method for planing a resist layer which is applied on a partially raised supporting surface, a resist structure, especially an encapsulation for electronic components, is obtained. To this end, a dry resist film (2) which is comprised of a composite made of a temperature resistant protective film (3) and of a photosensitive layer (4) is applied with the photosensitive layer (4) thereof on the supporting surface (6). The dry resist film (2d) is planed using pressure and heat, whereupon the photosensitive layer is exposed. Afterwards, the protective film (3) is removed and the photosensitive layer is developed.
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