发明名称 Cleaning wafer substrates of metal contamination while maintaining wafer smoothness
摘要 Microelectronics wafer substrate surfaces are cleaned to remove metal contamination while maintaining wafer substrate surface smoothness by contacting the wafer substrate surfaces with an aqueous cleaning solution of an alkaline, metal ion-free base and a polyhydroxy compound containing from two to ten -OH groups and having the formula: wherein or in which -R-, -R1-, -R2- and -R3- are alkylene radicals containing two to ten carbon atoms, x is a whole integer of from 1 to 4 and y is a whole integer of from 1 to 8, with the proviso that the number of carbon atoms in the polyhydroxy compound does not exceed ten, and wherein the water present in the aqueous cleaning solution is at least about 40% by weight of the cleaning composition.
申请公布号 US5989353(A) 申请公布日期 1999.11.23
申请号 US19960729565 申请日期 1996.10.11
申请人 MALLINCKRODT BAKER, INC. 发明人 SKEE, DAVID C.;SCHWARTZKOPF, GEORGE
分类号 B08B3/04;C11D7/26;C11D7/32;C11D7/50;C11D11/00;(IPC1-7):C03C23/00;B08B7/00;C11D9/00;C11D17/00 主分类号 B08B3/04
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