发明名称 |
Method for detecting opens through time variant current measurement |
摘要 |
A method for detecting open circuits in a semiconductor device, more specifically in a static CMOS device. A device to be tested is powered-up and the clock on the device is stopped so that the device enters a quiescent state. Once the device has reached a quiescent state a first current is measured and after a specified period of time a second current is also measured. The first current and the second current are then compared to determine if there is a defect, i.e. an open circuit, in the device. The determination as to whether or not a device is defective is based upon the difference between the first and second current measurements.
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申请公布号 |
US5990699(A) |
申请公布日期 |
1999.11.23 |
申请号 |
US19960587088 |
申请日期 |
1996.01.16 |
申请人 |
INTEL CORPORATION |
发明人 |
MILLER, ANTHONY C.;NEEDHAM, WAYNE M. |
分类号 |
G01R31/02;G01R31/26;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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