发明名称 ELECTRON MICROSCOPE AND SPECTROSCOPY SYSTEM
摘要 <p>An electron microscope (10) is adapted to enable spectroscopic analysis of a sample (16). A parabolic mirror (18) has a central aperture (20) through which the electron beam can pass. The mirror (18) focuses laser illumination from a transverse optical path (24) onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system (30). The mirror (18) is retractable (within the vacuum of the electron microscope) by a sliding arm assembly (22).</p>
申请公布号 WO1999058939(A1) 申请公布日期 1999.11.18
申请号 GB1999001395 申请日期 1999.05.05
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