| 发明名称 |
Test mode circuit for a micro controller |
| 摘要 |
The test mode control circuit (10) for a micro computer system (MCU) has a reset pin (10.2) and a clock pin (10.3) and avoids the need for a separate test pin. This provides a facility requiring few pins and is coupled to a test mode counter (30) that generates code that is decoded (40) to identify the modes. |
| 申请公布号 |
DE19855182(A1) |
申请公布日期 |
1999.11.18 |
| 申请号 |
DE1998155182 |
申请日期 |
1998.11.30 |
| 申请人 |
LG SEMICON CO., LTD. |
发明人 |
KIM, HO HYUN |
| 分类号 |
G06F11/22;G01R31/317;G06F11/267;G06F15/78;(IPC1-7):G06F11/22;G06F1/24 |
主分类号 |
G06F11/22 |
| 代理机构 |
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代理人 |
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| 主权项 |
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