发明名称
摘要 <p>PURPOSE:To detect the contact between a cutter and a suction surface by constituting the suction surface from a porous ceramics, forming a conductive film on the surface, or forming the porous ceramics from an electric conductive ceramics and discharging the static electricity of a semiconductor wafer. CONSTITUTION:A vacuum suction device 1 forms a suction surface 2a by fixing a porous plate 2 on a substrate body 3, and a semiconductor wafer W, etc., are suction on the absorbing surface 2a through the vacuum suction by a suction hole 3a. The porous plate 2 consists of a porous ceramics which is formed to a conductive film by applying metal plating on the surface or a porous ceramics which possesses electric conductivity, and the suction surface 2a possesses electric conductivity. If the porous plate 2 is connected with a grounding 4, the static electricity generated on the semiconductor wafer W can be discharged. Further, when the electric conduction between a cutter 6 and the porous plate 2 is detected by a detector 5, the contact between the cutter 6 and the suction surface 2a can be easily detected, when cutting is completed, and the cutting-in of the cutter 6 to the suction surface 2a can be prevented.</p>
申请公布号 JP2979194(B2) 申请公布日期 1999.11.15
申请号 JP19900143364 申请日期 1990.05.31
申请人 KYOSERA KK 发明人 MISHIMA KAZUHIKO;WATAKE TOSHIICHI
分类号 B23Q3/08;B23D59/00;B28D5/00;H01L21/683;(IPC1-7):B23Q3/08;H01L21/68 主分类号 B23Q3/08
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