A TEST BOARD HAVING A CAPACITOR CHARGING CIRCUIT AND A TEST METHOD USING THE TEST BOARD,申请号KR19970031457-传众专利搜索

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发明名称	A TEST BOARD HAVING A CAPACITOR CHARGING CIRCUIT AND A TEST METHOD USING THE TEST BOARD
摘要
申请公布号	KR100231649(B1)	申请公布日期	1999.11.15
申请号	KR19970031457	申请日期	1997.07.08
申请人	SAMSUNG ELECTRONICS CO, LTD.	发明人	SHIM, WEON-SEOB;PARK, WON-SIK;CHOI, CHAN-HO;KWON, YONG-SU
分类号	G01R31/26;G01R31/28;G01R31/316;G01R31/319;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28	主分类号	G01R31/26
代理机构		代理人
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地址

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