Meßgerät zur Vermessung von Strukturen auf einem transparenten Substrat

摘要

A device for measuring structures (9) on a transparent substrate (8), comprising a vertical illuminator device (10, 13), an imaging device (10) and a detector device (14) for the imaged structures (9), in addition to a displaceable measuring stage (4) which can be measured inferometrically (7) and is arranged in a vertical and relative position with regard to the optical axis (11) of the imaging device (11) in order to receive the substrate (8). The invention is characterized in that the measuring stage (4) is configured as an open frame with a edge that receives the substrate (8) and a transilluminator device (15, 16) is provided underneath the measuring stage (4), whereby the optical axis of said transilluminator device is aligned with the vertical illuminator device (10, 13).