发明名称 Planarized contact plug
摘要 <p>Initially, a conductive structure 104 is formed on a semiconductor substrate 100 having a plurality of diffusion regions therein. A first insulating layer 106 is formed over the semiconductor substrate 100 including the conductive structure 104. The first insulating layer is etched using a contact hole forming mask to form a contact hole 108. A conductive layer 110 is formed on the first insulating layer 106, filling up the contact hole 108 with the conductive layer 110. The conductive layer is etched until an upper surface of the first insulating layer is exposed. A second insulating layer 112 is formed over the first insulating layer 106. A contact plug 110a free of void can be formed and simultaneously a substrate surface is planarized by planarization-etching the second and first insulating layers.</p>
申请公布号 GB2337161(A) 申请公布日期 1999.11.10
申请号 GB19990009486 申请日期 1999.04.23
申请人 * SAMSUNG ELECTRONICS CO LIMITED 发明人 BO-UN * YOON;SEOK-JI * HONG
分类号 H01L21/3205;H01L21/28;H01L21/321;H01L21/3213;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/3205
代理机构 代理人
主权项
地址