发明名称 Method of manufacturing semiconductor monocrystalline mirror-surface wafers which includes a gas phase etching process, and semiconductor monocrystalline mirror-surface wafers manufactured by the method
摘要 A method of manufacturing a semiconductor monocrystalline mirror-surface wafer includes at least a gas phase etching process and a mirror-surface polishing process. The mirror-surface polishing process is composed of coarse polishing and finishing polishing, and only the coarse polishing is performed prior to the gas phase etching process, while the finishing polishing is carried out after the gas phase etching process. In addition, a heat treatment process is performed after the gas phase etching process but before the final cleaning process. The heat treatment process also serves as a donor-annihilation heat treatment process. The method can manufacture semiconductor monocrystalline mirror-surface wafers having a high degree of flatness, while resolving the problems involved in the conventional method; i.e., haze produced on a wafer surface, the introduction of strain and defects in the surface, high cost, and low productivity.
申请公布号 US5981392(A) 申请公布日期 1999.11.09
申请号 US19970824176 申请日期 1997.03.26
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 OISHI, HIROSHI
分类号 H01L21/302;C30B33/00;H01L21/304;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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