发明名称 WAFER FLATTENING DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the wafer machining accuracy of a flattening device for machining the surface of the wafer. SOLUTION: In this device, an air cylinder device 94 for push-pressing a wafer 26 and a cup type grinding wheel 64 by a properly controlled pressure relatively is provided on a finish grinding stage 20. After driving this air cylinder device 94, the wafer 26 is ground while push-pressing the wafer 26 and cup type grinding wheel 64 by a controlled pressure. Thereby, as the grinding by the minute feeding which is difficult to reach in a screw feeding device is possible, the machined accuracy of the wafer 26 can be improved.
申请公布号 JPH11309664(A) 申请公布日期 1999.11.09
申请号 JP19980117338 申请日期 1998.04.27
申请人 TOKYO SEIMITSU CO LTD 发明人 ISHIKAWA TOSHIHIKO;KATAGIRI YASUSHI
分类号 B24B37/005;B24B37/07;H01L21/304 主分类号 B24B37/005
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