| 摘要 |
PROBLEM TO BE SOLVED: To shorten inspection time in an inspection process. SOLUTION: An inspection disk 11 includes a sine wave signal recording track formed in its recording surface. This inspection disk 11 also includes a defect pattern 15 formed as a pseudo defect part. The defect pattern 15 is composed of three kinds of defect patterns, interruption 16, black band 17 and finger print 18, and these patterns are provided so as to be separated in a circumferential direction. Thus, the interruption 16, the black band 17 and the finger print 18 are formed in positions intersecting the same recording track recorded in a recording surface lie. In an inspection process, plural kinds of pseudo defect parts are continuously detected without moving a pickup in a disk radial direction and, thus, by omitting the moving operation of the pickup, inspection time is shortened. |
