发明名称 |
Regeneration method and apparatus of wafer and substrate |
摘要 |
A method for regenerating a used wafer or substrate by removing a functional coating film formed on the used wafer or substrate, comprising the steps of: (a) a step for sorting the used wafer or substrate according to the quality, structure or thickness of the functional coating film; (b) a step for removing the functional coating film, while in a state of holding the used wafer or substrate, (i) by lapping the objective face of the used wafer or substrate with a hard metal-bonded whetstone while applying an electrochemical in-process dressing, (ii) by polishing the objective face while dropping a fine-particle polishing slurry between a polishing plate provided with a pad and the functional coating film, or (iii) by electrolyzing the functional coating film on the objective face placed opposite to an electrode face in an electrolyte solution at a predetermined voltage; (c) a step for mechanically removing the functional coating film adhered to the end face at an adequate stage; and (d) a step for washing and drying the used wafer or substrate after removal of the functional coating film.
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申请公布号 |
US5981301(A) |
申请公布日期 |
1999.11.09 |
申请号 |
US19970804732 |
申请日期 |
1997.02.21 |
申请人 |
KABUSHIKI KAISHA KOBE SEIKO SHO |
发明人 |
MURAMATSU, KAZUO;KAWAI, AKIHIRO;WATANABE, TSUTOMU;SHIMAMOTO, SATOSHI |
分类号 |
B24B51/00;B24B53/00;H01L21/02;H01L21/304;H01L21/306;H01L21/66;H01L23/544;(IPC1-7):H01L21/00 |
主分类号 |
B24B51/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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