发明名称 Regeneration method and apparatus of wafer and substrate
摘要 A method for regenerating a used wafer or substrate by removing a functional coating film formed on the used wafer or substrate, comprising the steps of: (a) a step for sorting the used wafer or substrate according to the quality, structure or thickness of the functional coating film; (b) a step for removing the functional coating film, while in a state of holding the used wafer or substrate, (i) by lapping the objective face of the used wafer or substrate with a hard metal-bonded whetstone while applying an electrochemical in-process dressing, (ii) by polishing the objective face while dropping a fine-particle polishing slurry between a polishing plate provided with a pad and the functional coating film, or (iii) by electrolyzing the functional coating film on the objective face placed opposite to an electrode face in an electrolyte solution at a predetermined voltage; (c) a step for mechanically removing the functional coating film adhered to the end face at an adequate stage; and (d) a step for washing and drying the used wafer or substrate after removal of the functional coating film.
申请公布号 US5981301(A) 申请公布日期 1999.11.09
申请号 US19970804732 申请日期 1997.02.21
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO 发明人 MURAMATSU, KAZUO;KAWAI, AKIHIRO;WATANABE, TSUTOMU;SHIMAMOTO, SATOSHI
分类号 B24B51/00;B24B53/00;H01L21/02;H01L21/304;H01L21/306;H01L21/66;H01L23/544;(IPC1-7):H01L21/00 主分类号 B24B51/00
代理机构 代理人
主权项
地址