发明名称 |
Temperature sensing circuit for semiconductor junction temperature probe |
摘要 |
The temperature probe is biased for causing current flowing therethrough to be proportional to the probe temperature. A variable set point temperature is represented by a variable reference current which is summed with the temperature probe current. An output signal is produced therefrom to indicate the relationship between the set point temperature and the probe temperature.
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申请公布号 |
US4418339(A) |
申请公布日期 |
1983.11.29 |
申请号 |
US19800157477 |
申请日期 |
1980.06.09 |
申请人 |
EMHART INDUSTRIES, INC. |
发明人 |
SPOFFORD, JR., WALTER R.;POMERANTZ, DANIEL I. |
分类号 |
G01K3/00;G01K7/01;(IPC1-7):G08B17/06;G01K7/02 |
主分类号 |
G01K3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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