发明名称 Temperature sensing circuit for semiconductor junction temperature probe
摘要 The temperature probe is biased for causing current flowing therethrough to be proportional to the probe temperature. A variable set point temperature is represented by a variable reference current which is summed with the temperature probe current. An output signal is produced therefrom to indicate the relationship between the set point temperature and the probe temperature.
申请公布号 US4418339(A) 申请公布日期 1983.11.29
申请号 US19800157477 申请日期 1980.06.09
申请人 EMHART INDUSTRIES, INC. 发明人 SPOFFORD, JR., WALTER R.;POMERANTZ, DANIEL I.
分类号 G01K3/00;G01K7/01;(IPC1-7):G08B17/06;G01K7/02 主分类号 G01K3/00
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