发明名称 MEASURING METHOD FOR LIQUID CRYSTAL LAYER THICKNESS
摘要 PROBLEM TO BE SOLVED: To accurately measure the liquid crystal layer thickness of a liquid crystal cell. SOLUTION: A pair of light deflecting plates are arranged in both side of a liquid crystal cell in the predetermined condition and the spectral distribution of the transmitted light is measured in the condition of no voltage applied between electrodes of the liquid crystal cell, and chromaticity of the transmitted light is displayed on a CIE chromaticity graph, and the liquid crystal layer thickness is obtained on the basis of the angleθof inclination against the x-axis of a straight line L passing through an achromatic color point WP on the chromaticity graph and a point CP for expressing the chromaticity of the transmitted light.
申请公布号 JPH11304434(A) 申请公布日期 1999.11.05
申请号 JP19980112012 申请日期 1998.04.22
申请人 CASIO COMPUT CO LTD 发明人 FUJII HIROYUKI
分类号 G01B11/06;G01J3/46;G02F1/13;(IPC1-7):G01B11/06 主分类号 G01B11/06
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