发明名称 REFORMING METHOD OF THIN FILM AND DEVICE USED FOR ITS OPERATION
摘要 PROBLEM TO BE SOLVED: To provide a reforming method of a thin film which prevents contraction of a substrate due to heating of a substrate and warp of a substrate, permits precise laser casting on a desired position which can be mechanically controlled, enables casting of a fine pattern of a line width of about 1μm on a substrate and permits heating of a substrate to 500 deg.C or higher, while restraining contraction and warp of a substrate, and a device used for its operation. SOLUTION: When a semiconductor silicon thin film 102 on an insulating glass substrate 101 is crystallized by XeCl excimer laser 103, CO2 laser 104 of a wavelength of 9 to 11μm is cast on the substrate 101 simultaneously or before or after it to selectively heat a part of the substrate 101 in an area near an interface between the substrate 101 and the semiconductor thin film 102. According to this constitution, contraction of a substrate and warp of a substrate due to heating of a substrate can be prevented and precise irradiation to a desired position which can be mechanically controlled is possible. As a result, a fine pattern of a small focus depth and a line width of about 1μm can be cast on a substrate by the device.
申请公布号 JPH11307450(A) 申请公布日期 1999.11.05
申请号 JP19980108239 申请日期 1998.04.17
申请人 NEC CORP 发明人 TANABE HIROSHI
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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