发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To virtually realize a plurality of reference cells whose threshold voltage is prescribed strictly by only one real reference cell. SOLUTION: Only one reference cell is installed inside a chip, and its threshold voltage is built precisely in a manufacturing process. Its value is set at the upper-limit value of a threshold voltage, e.g. in the erasure state of a memory cell. The gate voltage of a reference cell and the gate voltage of a memory cell are constituted so as to be capable of being set independently. The relative difference between the gate voltage of the memory cell and the gate voltage of the reference cell is changed according to a write verifying operation, an erasure verifying operation and an excess erasure verifying operation.</p>
申请公布号 JPH11306785(A) 申请公布日期 1999.11.05
申请号 JP19980116595 申请日期 1998.04.27
申请人 NEC CORP 发明人 KAMIKUBO MASAKI
分类号 G11C16/06;G11C16/28;G11C16/34;(IPC1-7):G11C16/06 主分类号 G11C16/06
代理机构 代理人
主权项
地址