| 摘要 |
A method and system for measuring sensitivity of an electrophotography photoconductor. The sensitivity is determined using changing information of the surface potential of the photoconductor and an exposure amount information which is precisely obtained by measuring relative illuminance on the surface of the photoconductor with a photo-sensor disposed between a shutter performing ON/OFF operations of light and the photoconductor while the photoconductor is exposed to light. Then, a changing curve of digitized measured relative illuminance is integrated from a rising point thereof to a point thereof at a time when the surface potential information becomes a specified value.
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