发明名称 Semiconductor device and manufacturing method thereof
摘要 A pin diode is formed by a p+ collector region, an n type buffer region, an n- region and an n+ cathode region. A trench is formed from the surface of n+ cathode region through n+ cathode region to reach n- region. An insulating film is formed along an inner wall surface of trench. A gate electrode layer is formed to oppose to the sidewall of n+ cathode region with insulating film interposed. A cathode electrode is formed to be electrically connected to n+ cathode region. An anode electrode is formed to be electrically connected to p+ collector region. The n+ cathode region is formed entirely over the surface between trenches extending parallel to each other. Thus, a power semiconductor device in which gate control circuit is simplified and which has good on property can be obtained.
申请公布号 US5977570(A) 申请公布日期 1999.11.02
申请号 US19960683279 申请日期 1996.07.18
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TAKAHASHI, TETSUO;NAKAMURA, KATSUMI;MINATO, TADAHARU;HARADA, MASANA
分类号 H01L29/74;H01L21/331;H01L21/332;H01L29/06;H01L29/739;H01L29/745;H01L29/749;H01L29/76;H01L29/78;H01L29/861;H01L29/868;H01L29/94;H01L31/111;H01L31/113;(IPC1-7):H01L29/74 主分类号 H01L29/74
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