发明名称 High-voltage-resistant MOS transistor, and corresponding manufacturing process
摘要 A MOS transistor capable of withstanding relatively high voltages is of a type integrated on a region included in a substrate of semiconductor material, having conductivity of a first type and comprising a channel region intermediate between a first active region of source and a second active region of drain. Both these source and drain regions have conductivity of a second type and extend from a first surface of the substrate. The transistor also has a gate which includes at least a first polysilicon layer overlying the first surface of at least the channel region, to which it is coupled capacitively through a gate oxide layer. According to the invention, the first polysilicon layer includes a mid-portion which only overlies the channel region and has a first total conductivity of the first type, and a peripheral portion with a second total conductivity differentiated from the first total conductivity. The peripheral portion partly overlies the source and drain active regions toward the channel region.
申请公布号 US5977591(A) 申请公布日期 1999.11.02
申请号 US19970824888 申请日期 1997.03.18
申请人 SGS-THOMSON MICROELECTRONICS S.R.L. 发明人 FRATIN, LORENZO;RIVA, CARLO
分类号 H01L21/28;H01L21/336;H01L29/49;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062 主分类号 H01L21/28
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