发明名称 Polishing pad with incompressible, highly soluble particles for chemical-mechanical planarization of semiconductor wafers
摘要 A hard polishing pad with a porous surface for use in chemical-mechanical planarization of semiconductor wafers. The polishing pad has a body with a planarizing surface upon which a slurry may be deposited, and a plurality of particles are suspended in the body. The body is made from a continuous phase matrix material, and the particles are made from a substantially incompressible material that is soluble in the slurry. As a wafer is planarized, the particles at the planarizing surface of the polishing pad dissolve in the slurry and create pores in the pad. Also, because the particles are substantially incompressible, they reinforce the pad to provide a hard, substantially incompressible pad.
申请公布号 US5976000(A) 申请公布日期 1999.11.02
申请号 US19990229476 申请日期 1999.01.13
申请人 MICRON TECHNOLOGY, INC. 发明人 HUDSON, GUY F.
分类号 B24B37/04;B24D3/28;B24D3/34;B24D7/04;(IPC1-7):B24D17/00 主分类号 B24B37/04
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