发明名称 Projection exposure apparatus and method in which mask stage is moved to provide alignment with a moving wafer stage
摘要 A projection exposure apparatus for positioning, for each shot provided on a wafer, a pattern formed on a mask with respect to the wafer and also for exposing the pattern on the wafer includes a wafer stage carrying the wafer and movable stepwise for each shot, a mask stage carrying the mask and movable, a stage control unit for making relative positioning between the wafer and the pattern of the mask and maintaining the relative positioning so that the stage control unit moves the mask stage to make the relative positioning before the wafer stage stops for each shot, and an exposure control unit for performing exposure while the relative positioning is maintained.
申请公布号 US5978071(A) 申请公布日期 1999.11.02
申请号 US19980084211 申请日期 1998.05.26
申请人 NIKON CORPORATION 发明人 MIYAJIMA, HIDEYUKI;MAKINOUCHI, SUSUMU;OTA, KAZUYA
分类号 G03F7/20;G03F9/00;(IPC1-7):G03B27/42;G03B27/52;G03B27/54;G03B27/72 主分类号 G03F7/20
代理机构 代理人
主权项
地址