SEMICONDUCTOR INTEGRATED CIRCUIT HAVING CONTROLLER AND LARGE-CAPACITY MEMORY AND METHOD OF TESTING THE SAME

摘要

A semiconductor integrated circuit device comprises, on a semiconductor chip (100), a large-scale memory (1) as a main memory, a controller (2) for controlling at least inputting data from the outside of the chip (100) to the large-scale memory (1), and outputting data from the large-scale memory (1) to the outside of the chip (100), and a self-test circuit (3) for testing the large-scale memory (1). The self-test circuit includes a rewritable EEPROM (34), into which a self-test sequence is written. The self-test circuit (3) tests the large-scale memory (1) in accordance with the self-test sequence written in the EEPROM (34).