发明名称 SAMPLE MOUNTING TOOL FOR TRANSMISSION TYPE ELECTRON MICROSCOPE AND ITS USE
摘要 PROBLEM TO BE SOLVED: To load an analyte sample on a sample loading part without damaging the analyzed sample even if the analyzed sample has a thickness not less than 200μm. SOLUTION: A sample setter 17 for a transmission type electron microscope that is used to load a specimen sample 15 located on a sample mounting member 14 on a sample loading part 5 by screwing a male screw 6a of a sample presser member 6 to a female screw 5a of the sample loading part 5 of a sample supporting member 2 has a length vertically, and is provided with: an operational holding part 21 to be operated by being picked up by fingers; and claws 18 which extend downward from the multiple positions of the peripheral part of the lower end part 21a in the operational holding part 21 and of which tips 18a are so formed as to separated downward from the lower end part 21a of the operational holding part 21 and of which tips 18a can be engaged with respective engaging recessed parts 6b of the sample presser member 6.
申请公布号 JPH11297251(A) 申请公布日期 1999.10.29
申请号 JP19980097913 申请日期 1998.04.09
申请人 SONY CORP 发明人 IKEDA YUJI
分类号 H01J37/20;H01J37/26;(IPC1-7):H01J37/20 主分类号 H01J37/20
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