| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor test program debugging apparatus allowing the labor and time for detecting the free pass condition to be reduced. SOLUTION: A free pass detector 40 comprises an evaluating object pin calculator 42, strobe output condition judging part 44, strobe output verifying part 46 and report preparing/output part 48. The evaluating object pin calculator 42 calculates the evaluating object pin, based on expectation data contained in a pattern program, the strobe output condition judging part 44 identifies evaluating object pins corresponding to the strobe signals, based on test data generated according to strobe output conditions contained in a device program, the strobe output verifying part 46 verifies whether strobe signals are set so as to corresponding to their respective evaluating object pins for which the expectation data are set. |
