SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEST METHOD THEREOF,申请号JP19980096486-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEST METHOD THEREOF
摘要
申请公布号	JPH11297099(A)	申请公布日期	1999.10.29
申请号	JP19980096486	申请日期	1998.04.08
申请人	SEIKO EPSON CORP	发明人	KOBAYASHI KATSUMI
分类号	G01R31/28;G11C29/00;G11C29/12;(IPC1-7):G11C29/00	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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