发明名称 |
CONFIGURATION CONTROL IN A PROGRAMMABLE LOGIC DEVICE USING NON-VOLATILE ELEMENTS |
摘要 |
A boundary scan test circuit (JTAG) interface is used to provide data for a set of configuration latches (151) within a Configuration Register (150). The Configuration Register (150) is included within the JTAG structure as a Test Data Register (TDR) (180). Each configuration bit within the Configuration Register (150) consists of a Configuration Latch (151), and each configuration latch (151) has an output used as a configuration control signal (160) within an output logic macrocell. The configuration register's input signal (149) is selectively provided from either a set of serially connected configuration bit non-volatile element sense latches (120) or from the JTAG Test Data In (TDI) data pin (101) for configuration, prototyping, and testing.
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申请公布号 |
WO9954839(A1) |
申请公布日期 |
1999.10.28 |
申请号 |
WO1999US06355 |
申请日期 |
1999.03.23 |
申请人 |
ATMEL CORPORATION |
发明人 |
RAMAMURTHY, SRINIVAS;FAHEY, JAMES;SAIKI, WILLIAM, J.;BERGER, NEAL;GONGWER, GEOFFREY, S.;TAM, EUGENE, JINGLUN |
分类号 |
G01R31/28;G01R31/3185;(IPC1-7):G06F31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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