发明名称 |
Method for controlling a test mode of an electric device |
摘要 |
A method for performing a test and controlling the test mode of an electric device. The method reduces the amount of time and labor expended during fabrication, and accordingly enhances productivity by detecting time information from a timer (a clock generator, or a variable clock generator) and multiplying the detected time information by a predetermined value, and controlling the driving time of the device during a test operation in response to the multiplied time value.
|
申请公布号 |
US5974364(A) |
申请公布日期 |
1999.10.26 |
申请号 |
US19980013999 |
申请日期 |
1998.01.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, IN-SOO |
分类号 |
G01R31/317;(IPC1-7):G06F11/00 |
主分类号 |
G01R31/317 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|